The traditional approach to moving scan test data from chip-level pins to core-level scan channels is under pressure due to the dramatic rise in design size, design complexity, and test adaptation. To ...

For decades, process and design scaling has triggered the adoption of transformative test solutions. About twenty years ago, when at-speed test became a de-facto requirement, on-chip compression ...

The cost of manufacturing printed circuit board assemblies (PCBAs) has always been a concern for original equipment manufacturers (OEM) and contract manufacturers (CM). This is one of the reasons why ...

ScanExpress JET bridges the gap between JTAG and functional test methods, providing a superior solution to customers requiring the highest test coverage ScanExpress JET carries existing boundary-scan ...

When a global provider of air traffic, navigation, and landing system solutions began implementing its next-generation system, limitations of an existing test and debug methodology directly impacted ...