The final installment in a four-part series article focuses on the inspection phase when using CAD/CAM tools to design a golf putter. CAD/CAM software used for CNC programming and simulation could ...

Line-scan vs. area-scan cameras. Key ingredients to the high-speed machine-vision system for inspection. How to synchronize the wafers with the camera. Optical semiconductor inspection presents ...

AXI is an effective technology for finding manufacturing defects in electronics assembly operations. Manufacturers of advanced electronics products know that simultaneously producing a ...

Wafers can be inspected for large, obvious defects, or for small, subtle ones. The former is referred to as macro-inspection, while the latter is micro-inspection. These processes use different ...

To ensure that the speed of composites fabrication keeps pace with customer demand, the ability to inspect and monitor composite part quality must become an integral part of high-rate part ...